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Journal: Micromachines, 2022
Volume: 13
Number: 800
Article:
Impact of the Semiconductor Defect Density on Solution-Processed Flexible Schottky Barrier Diodes
Authors:
by
Julio C. Tinoco, Samuel A. Hernandez, MarÃa de la Luz Olvera, Magali Estrada, Rodolfo GarcÃa and Andrea G. Martinez-Lopez
Link:
https://www.mdpi.com/2072-666X/13/5/800
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