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Journal: Micromachines, 2022
Volume: 13
Number: 466
466
Article: Investigation on the Thermal Characteristics of Enhancement-Mode p-GaN HEMT Device on Si Substrate Using Thermoreflectance Microscopy
Authors: by Hongyue Wang, Chao Yuan, Yajie Xin, Yijun Shi, Yaozong Zhong, Yun Huang and Guoguang Lu
Link: https://www.mdpi.com/2072-666X/13/3/466

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