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Journal: Micromachines, 2022
Volume: 13
Number: 176

Article: Improving Breakdown Voltage and Threshold Voltage Stability by Clamping Channel Potential for Short-Channel Power p-GaN HEMTs
Authors: by Hongyue Wang, Yijun Shi, Yajie Xin, Chang Liu, Guoguang Lu and Yun Huang
Link: https://www.mdpi.com/2072-666X/13/2/176

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