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Journal: Micromachines, 2021
Volume: 12
Number: 751

Article: Physics-Based TCAD Simulation and Calibration of 600 V GaN/AlGaN/GaN Device Characteristics and Analysis of Interface Traps
Authors: by Yu-Lin Song, Manoj Kumar Reddy, Luh-Maan Chang and Gene Sheu
Link: https://www.mdpi.com/2072-666X/12/7/751

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