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Journal: Micromachines, 2021
Volume: 12
Number: 1145

Article: Modeling of Statistical Variation Effects on DRAM Sense Amplifier Offset Voltage
Authors: by Kyung Min Koo, Woo Young Chung, Sang Yi Lee, Gyu Han Yoon and Woo Young Choi
Link: https://www.mdpi.com/2072-666X/12/10/1145

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