Dang, N.M.; Wang, Z.-Y.; Wu, T.-Y.; Nguyen, T.A.K.; Lin, M.-T.
Measurement of Effects of Different Substrates on the Mechanical Properties of Submicron Titanium Nickel Shape Memory Alloy Thin Film Using the Bulge Test. Micromachines 2021, 12, 85.
https://doi.org/10.3390/mi12010085
AMA Style
Dang NM, Wang Z-Y, Wu T-Y, Nguyen TAK, Lin M-T.
Measurement of Effects of Different Substrates on the Mechanical Properties of Submicron Titanium Nickel Shape Memory Alloy Thin Film Using the Bulge Test. Micromachines. 2021; 12(1):85.
https://doi.org/10.3390/mi12010085
Chicago/Turabian Style
Dang, Nhat Minh, Zhao-Ying Wang, Ti-Yuan Wu, Tra Anh Khoa Nguyen, and Ming-Tzer Lin.
2021. "Measurement of Effects of Different Substrates on the Mechanical Properties of Submicron Titanium Nickel Shape Memory Alloy Thin Film Using the Bulge Test" Micromachines 12, no. 1: 85.
https://doi.org/10.3390/mi12010085
APA Style
Dang, N. M., Wang, Z.-Y., Wu, T.-Y., Nguyen, T. A. K., & Lin, M.-T.
(2021). Measurement of Effects of Different Substrates on the Mechanical Properties of Submicron Titanium Nickel Shape Memory Alloy Thin Film Using the Bulge Test. Micromachines, 12(1), 85.
https://doi.org/10.3390/mi12010085