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Open AccessArticle
Downscaling Method for Crop Yield Statistical Data Based on the Standardized Deviation from the Mean of the Comprehensive Crop Condition Index
by
Ke Luo
Ke Luo 1,2,
Jianqiang Ren
Jianqiang Ren 1,2,*,
Xiangxin Bu
Xiangxin Bu 1,2 and
Hongwei Zhao
Hongwei Zhao 1,2
1
State Key Laboratory of Efficient Utilization of Arable Land in China, Institute of Agricultural Resources and Regional Planning, Chinese Academy of Agricultural Sciences, Beijing 100081, China
2
Key Laboratory of Agricultural Remote Sensing, Ministry of Agriculture and Rural Affairs, Institute of Agricultural Resources and Regional Planning, Chinese Academy of Agricultural Sciences, Beijing 100081, China
*
Author to whom correspondence should be addressed.
Remote Sens. 2025, 17(20), 3408; https://doi.org/10.3390/rs17203408 (registering DOI)
Submission received: 30 August 2025
/
Revised: 9 October 2025
/
Accepted: 10 October 2025
/
Published: 11 October 2025
Abstract
Spatializing crop yield statistical data with administrative divisions as the basic unit helps reveal the spatial distribution characteristics of crop yield and provides necessary spatial information to support field management and government decision-making. However, owing to an insufficient understanding of the factors affecting yield, accurately depicting its spatial differences remains challenging. Taking Hailun city, Heilongjiang Province, as an example, this study proposes a yield downscaling method based on the standardized deviation from the mean of the comprehensive crop condition index (CCCI) during key phenological periods of the growing season. First, Sentinel-2 remote sensing data were used to retrieve crop condition parameters during key phenological periods, and the CCCI was constructed using the correlation between crop condition parameters in key phenological periods and statistical yield as the weight. Subsequently, regression analysis and the entropy weight method were applied to determine the spatiotemporal dynamic weights of the CCCI during key phenological stages and to calculate the standardized deviation from the mean. By combining these two components, the comprehensive spatial difference index of the crop growth condition (CSDICGC) was derived, which offered a new way to characterize the discrepancies between the pixel-level yield and statistical yield, thereby downscaling the yield statistical data from the administrative unit to the pixel scale. The results indicated that this method achieved a regional accuracy close to 100%, with a strong fit at the pixel scale. Pixel-level accuracy validation against ground-truth maize yield data resulted in an R2 of 0.82 and a mean relative error (MRE) of 4.75%. The novelty of this study was characterized by the integration of multistage crop condition parameters with dynamic spatiotemporal weighting to overcome the limitations of single-index methods. The crop yield statistical data downscaling spatialization method proposed in this paper is simple and efficient and has the potential to be popularized and applied over relatively large regions.
Share and Cite
MDPI and ACS Style
Luo, K.; Ren, J.; Bu, X.; Zhao, H.
Downscaling Method for Crop Yield Statistical Data Based on the Standardized Deviation from the Mean of the Comprehensive Crop Condition Index. Remote Sens. 2025, 17, 3408.
https://doi.org/10.3390/rs17203408
AMA Style
Luo K, Ren J, Bu X, Zhao H.
Downscaling Method for Crop Yield Statistical Data Based on the Standardized Deviation from the Mean of the Comprehensive Crop Condition Index. Remote Sensing. 2025; 17(20):3408.
https://doi.org/10.3390/rs17203408
Chicago/Turabian Style
Luo, Ke, Jianqiang Ren, Xiangxin Bu, and Hongwei Zhao.
2025. "Downscaling Method for Crop Yield Statistical Data Based on the Standardized Deviation from the Mean of the Comprehensive Crop Condition Index" Remote Sensing 17, no. 20: 3408.
https://doi.org/10.3390/rs17203408
APA Style
Luo, K., Ren, J., Bu, X., & Zhao, H.
(2025). Downscaling Method for Crop Yield Statistical Data Based on the Standardized Deviation from the Mean of the Comprehensive Crop Condition Index. Remote Sensing, 17(20), 3408.
https://doi.org/10.3390/rs17203408
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