Rofatto, V.F.; Matsuoka, M.T.; Klein, I.; Roberto Veronez, M.; da Silveira, L.G., Jr.
A Monte Carlo-Based Outlier Diagnosis Method for Sensitivity Analysis. Remote Sens. 2020, 12, 860.
https://doi.org/10.3390/rs12050860
AMA Style
Rofatto VF, Matsuoka MT, Klein I, Roberto Veronez M, da Silveira LG Jr.
A Monte Carlo-Based Outlier Diagnosis Method for Sensitivity Analysis. Remote Sensing. 2020; 12(5):860.
https://doi.org/10.3390/rs12050860
Chicago/Turabian Style
Rofatto, Vinicius Francisco, Marcelo Tomio Matsuoka, Ivandro Klein, MaurÃcio Roberto Veronez, and Luiz Gonzaga da Silveira, Jr.
2020. "A Monte Carlo-Based Outlier Diagnosis Method for Sensitivity Analysis" Remote Sensing 12, no. 5: 860.
https://doi.org/10.3390/rs12050860
APA Style
Rofatto, V. F., Matsuoka, M. T., Klein, I., Roberto Veronez, M., & da Silveira, L. G., Jr.
(2020). A Monte Carlo-Based Outlier Diagnosis Method for Sensitivity Analysis. Remote Sensing, 12(5), 860.
https://doi.org/10.3390/rs12050860