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Journal: Remote Sens., 2019
Volume: 11
Number: 1768
Article:
Winter Wheat Yield Assessment from Landsat 8 and Sentinel-2 Data: Incorporating Surface Reflectance, Through Phenological Fitting, into Regression Yield Models
Authors:
by
Sergii Skakun, Eric Vermote, Belen Franch, Jean-Claude Roger, Nataliia Kussul, Junchang Ju and Jeffrey Masek
Link:
https://www.mdpi.com/2072-4292/11/15/1768
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