Introduction to the Special Issue “Uncertainty in Remote Sensing Image Analysis”
Faculty of Geo-information Science and Earth Observation (ITC), University of Twente, 7531 LG Enschede, The Netherlands
State Key Laboratory of Resources & Environmental Information System, Institute of Geographical Sciences and Natural Resources Research, Chinese Academy of Sciences, Beijing 100101, China
University of Chinese Academy of Sciences, Beijing 100049, China
Department of Statistics, University of Pretoria, Pretoria 0002, South Africa
Author to whom correspondence should be addressed.
Received: 4 December 2018 / Accepted: 5 December 2018 / Published: 7 December 2018
Note: In lieu of an abstract, this is an excerpt from the first page.
Images obtained from satellites are of an increasing resolution. [...]
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MDPI and ACS Style
Stein, A.; Ge, Y.; Fabris-Rotelli, I. Introduction to the Special Issue “Uncertainty in Remote Sensing Image Analysis”. Remote Sens. 2018, 10, 1975.
Stein A, Ge Y, Fabris-Rotelli I. Introduction to the Special Issue “Uncertainty in Remote Sensing Image Analysis”. Remote Sensing. 2018; 10(12):1975.
Stein, Alfred; Ge, Yong; Fabris-Rotelli, Inger. 2018. "Introduction to the Special Issue “Uncertainty in Remote Sensing Image Analysis”." Remote Sens. 10, no. 12: 1975.
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