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NBTI-Aware Transient Fault Rate Analysis Method for Logic Circuit Based on Probability Voltage Transfer Characteristics

School of Electrical Engineering and Automation, Harbin Institute of Technology. No. 2 Yikuang Street, Harbin 150080, China
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Academic Editor: Paul M. Goggans
Algorithms 2016, 9(1), 9; https://doi.org/10.3390/a9010009
Received: 30 August 2015 / Revised: 5 November 2015 / Accepted: 14 January 2016 / Published: 18 January 2016
The reliability of Very Large Scale Integration (VLSI) circuits has become increasingly susceptible to transient faults induced by environmental noise with the scaling of technology. Some commonly used fault tolerance strategies require statistical methods to accurately estimate the fault rate in different parts of the logic circuit, and Monte Carlo (MC) simulation is often applied to complete this task. However, the MC method suffers from impractical computation costs due to the size of the circuits. Furthermore, circuit aging effects, such as negative bias temperature instability (NBTI), will change the characteristics of the circuit during its lifetime, leading to a change in the circuit’s noise margin. This change will increase the complexity of transient fault rate estimation tasks. In this paper, an NBTI-aware statistical analysis method based on probability voltage transfer characteristics is proposed for combinational logic circuit. This method can acquire accurate fault rates using a discrete probability density function approximation process, thus resolving the computation cost problem of the MC method. The proposed method can also consider aging effects and analyze statistical changes in the fault rates. Experimental results demonstrate that, compared to the MC simulation, our method can achieve computation times that are two orders of magnitude shorter while maintaining an error rate less than 9%. View Full-Text
Keywords: VLSI circuit; transient fault; aging effects; voltage transfer characteristics; discrete probability density function approximation VLSI circuit; transient fault; aging effects; voltage transfer characteristics; discrete probability density function approximation
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Yang, Z.; Li, J.; Yu, Y.; Peng, X. NBTI-Aware Transient Fault Rate Analysis Method for Logic Circuit Based on Probability Voltage Transfer Characteristics. Algorithms 2016, 9, 9.

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