X-Ray Spectroscopy of Ultra-Thin Oxide/Oxide Heteroepitaxial Films: A Case Study of Single-Nanometer VO2/TiO2
Abstract
:1. Introduction
2. Experimental Section
3. Results and Discussion
3.1. Probing Depth
3.1.1. HAXPES
3.1.2. XAS
3.2. Temperature-Dependent Electronic Structure
4. Conclusions
Acknowledgments
Author Contributions
Conflicts of Interest
References
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Quackenbush, N.F.; Paik, H.; Woicik, J.C.; Arena, D.A.; Schlom, D.G.; Piper, L.F.J. X-Ray Spectroscopy of Ultra-Thin Oxide/Oxide Heteroepitaxial Films: A Case Study of Single-Nanometer VO2/TiO2. Materials 2015, 8, 5452-5466. https://doi.org/10.3390/ma8085255
Quackenbush NF, Paik H, Woicik JC, Arena DA, Schlom DG, Piper LFJ. X-Ray Spectroscopy of Ultra-Thin Oxide/Oxide Heteroepitaxial Films: A Case Study of Single-Nanometer VO2/TiO2. Materials. 2015; 8(8):5452-5466. https://doi.org/10.3390/ma8085255
Chicago/Turabian StyleQuackenbush, Nicholas F., Hanjong Paik, Joseph C. Woicik, Dario A. Arena, Darrell G. Schlom, and Louis F. J. Piper. 2015. "X-Ray Spectroscopy of Ultra-Thin Oxide/Oxide Heteroepitaxial Films: A Case Study of Single-Nanometer VO2/TiO2" Materials 8, no. 8: 5452-5466. https://doi.org/10.3390/ma8085255