Bennet, K.E.; Lee, K.H.; Tomshine, J.R.; Sundin, E.M.; Kruchowski, J.N.; Durrer, W.G.; Manciu, B.M.; Kouzani, A.; Manciu, F.S.
Raman Microscopic Analysis of Internal Stress in Boron-Doped Diamond. Materials 2015, 8, 2782-2793.
https://doi.org/10.3390/ma8052782
AMA Style
Bennet KE, Lee KH, Tomshine JR, Sundin EM, Kruchowski JN, Durrer WG, Manciu BM, Kouzani A, Manciu FS.
Raman Microscopic Analysis of Internal Stress in Boron-Doped Diamond. Materials. 2015; 8(5):2782-2793.
https://doi.org/10.3390/ma8052782
Chicago/Turabian Style
Bennet, Kevin E., Kendall H. Lee, Jonathan R. Tomshine, Emma M. Sundin, James N. Kruchowski, William G. Durrer, Bianca M. Manciu, Abbas Kouzani, and Felicia S. Manciu.
2015. "Raman Microscopic Analysis of Internal Stress in Boron-Doped Diamond" Materials 8, no. 5: 2782-2793.
https://doi.org/10.3390/ma8052782
APA Style
Bennet, K. E., Lee, K. H., Tomshine, J. R., Sundin, E. M., Kruchowski, J. N., Durrer, W. G., Manciu, B. M., Kouzani, A., & Manciu, F. S.
(2015). Raman Microscopic Analysis of Internal Stress in Boron-Doped Diamond. Materials, 8(5), 2782-2793.
https://doi.org/10.3390/ma8052782