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Journal: Materials, 2025
Volume: 18
Number: 320
320
Article: Microwave Dielectric Properties and Defect Behavior of xTiO₂-(1-x)SiO₂ Glass
Authors: by Chenyang Zhang, Sijian Gao, Mankang Zhu, Zhufeng Shao, Lanjian Nie, Hui Wang, Yanan Jia and Bo Fu
Link: https://www.mdpi.com/1996-1944/18/2/320

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