Sapkota, D.R.; Ramanujam, B.; Pradhan, P.; Alaani, M.A.R.; Shan, A.; Heben, M.J.; Marsillac, S.; Podraza, N.J.; Collins, R.W.
Real-Time Spectroscopic Ellipsometry for Flux Calibrations in Multi-Source Co-Evaporation of Thin Films: Application to Rate Variations in CuInSe2 Deposition. Materials 2024, 17, 4048.
https://doi.org/10.3390/ma17164048
AMA Style
Sapkota DR, Ramanujam B, Pradhan P, Alaani MAR, Shan A, Heben MJ, Marsillac S, Podraza NJ, Collins RW.
Real-Time Spectroscopic Ellipsometry for Flux Calibrations in Multi-Source Co-Evaporation of Thin Films: Application to Rate Variations in CuInSe2 Deposition. Materials. 2024; 17(16):4048.
https://doi.org/10.3390/ma17164048
Chicago/Turabian Style
Sapkota, Dhurba R., Balaji Ramanujam, Puja Pradhan, Mohammed A. Razooqi Alaani, Ambalanath Shan, Michael J. Heben, Sylvain Marsillac, Nikolas J. Podraza, and Robert W. Collins.
2024. "Real-Time Spectroscopic Ellipsometry for Flux Calibrations in Multi-Source Co-Evaporation of Thin Films: Application to Rate Variations in CuInSe2 Deposition" Materials 17, no. 16: 4048.
https://doi.org/10.3390/ma17164048
APA Style
Sapkota, D. R., Ramanujam, B., Pradhan, P., Alaani, M. A. R., Shan, A., Heben, M. J., Marsillac, S., Podraza, N. J., & Collins, R. W.
(2024). Real-Time Spectroscopic Ellipsometry for Flux Calibrations in Multi-Source Co-Evaporation of Thin Films: Application to Rate Variations in CuInSe2 Deposition. Materials, 17(16), 4048.
https://doi.org/10.3390/ma17164048
