Ellakany, A.; Zekry, A.; Abouelatta, M.; Shaker, A.; Sayah, G.T.; El-Banna, M.M.
Analytical and Numerical Investigation of Nanowire Transistor X-ray Detector. Materials 2023, 16, 2637.
https://doi.org/10.3390/ma16072637
AMA Style
Ellakany A, Zekry A, Abouelatta M, Shaker A, Sayah GT, El-Banna MM.
Analytical and Numerical Investigation of Nanowire Transistor X-ray Detector. Materials. 2023; 16(7):2637.
https://doi.org/10.3390/ma16072637
Chicago/Turabian Style
Ellakany, Abdelhady, Abdelhalim Zekry, Mohamed Abouelatta, Ahmed Shaker, Gihan T. Sayah, and Mohamed M. El-Banna.
2023. "Analytical and Numerical Investigation of Nanowire Transistor X-ray Detector" Materials 16, no. 7: 2637.
https://doi.org/10.3390/ma16072637
APA Style
Ellakany, A., Zekry, A., Abouelatta, M., Shaker, A., Sayah, G. T., & El-Banna, M. M.
(2023). Analytical and Numerical Investigation of Nanowire Transistor X-ray Detector. Materials, 16(7), 2637.
https://doi.org/10.3390/ma16072637