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Journal: Materials, 2023
Volume: 16
Number: 4469

Article: Impact of Charge-Trapping Effects on Reliability Instability in AlxGa1−xN/GaN High-Electron-Mobility Transistors with Various Al Compositions
Authors: by Walid Amir, Surajit Chakraborty, Hyuk-Min Kwon and Tae-Woo Kim
Link: https://www.mdpi.com/1996-1944/16/12/4469

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