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Journal: Materials, 2022
Volume: 15
Number: 8637
8637
Article: Features of the Carrier Concentration Determination during Irradiation of Wide-Gap Semiconductors: The Case Study of Silicon Carbide
Authors: by Alexander A. Lebedev, Vitali V. Kozlovski, Klavdia S. Davydovskaya, Roman A. Kuzmin, Mikhail E. Levinshtein and Anatolii M. Strel’chuk
Link: https://www.mdpi.com/1996-1944/15/23/8637

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