Ariskina, R.; Stiller, M.; Precker, C.E.; Böhlmann, W.; Esquinazi, P.D.
On the Localization of Persistent Currents Due to Trapped Magnetic Flux at the Stacking Faults of Graphite at Room Temperature. Materials 2022, 15, 3422.
https://doi.org/10.3390/ma15103422
AMA Style
Ariskina R, Stiller M, Precker CE, Böhlmann W, Esquinazi PD.
On the Localization of Persistent Currents Due to Trapped Magnetic Flux at the Stacking Faults of Graphite at Room Temperature. Materials. 2022; 15(10):3422.
https://doi.org/10.3390/ma15103422
Chicago/Turabian Style
Ariskina, Regina, Markus Stiller, Christian E. Precker, Winfried Böhlmann, and Pablo D. Esquinazi.
2022. "On the Localization of Persistent Currents Due to Trapped Magnetic Flux at the Stacking Faults of Graphite at Room Temperature" Materials 15, no. 10: 3422.
https://doi.org/10.3390/ma15103422
APA Style
Ariskina, R., Stiller, M., Precker, C. E., Böhlmann, W., & Esquinazi, P. D.
(2022). On the Localization of Persistent Currents Due to Trapped Magnetic Flux at the Stacking Faults of Graphite at Room Temperature. Materials, 15(10), 3422.
https://doi.org/10.3390/ma15103422