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Journal: Materials, 2021
Volume: 14
Number: 4749

Article: Monitoring Electrical Biasing of Pb(Zr0.2Ti0.8)O3 Ferroelectric Thin Films In Situ by DPC-STEM Imaging
Authors: by Alexander Vogel, Martin F. Sarott, Marco Campanini, Morgan Trassin and Marta D. Rossell
Link: https://www.mdpi.com/1996-1944/14/16/4749

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