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Journal: Materials, 2021
Volume: 14
Number: 3191

Article: Surface Stoichiometry and Depth Profile of Tix-CuyNz Thin Films Deposited by Magnetron Sputtering
Authors: by Arun Kumar Mukhopadhyay, Avishek Roy, Gourab Bhattacharjee, Sadhan Chandra Das, Abhijit Majumdar, Harm Wulff and Rainer Hippler
Link: https://www.mdpi.com/1996-1944/14/12/3191

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