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Open AccessArticle

Effect of Passivation Layer on the Thin Film Perovskite Random Lasers

Department of Photonics, College of Electrical and Computer Engineering, National Chiao Tung University, Hsinchu 30010, Taiwan
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Materials 2020, 13(10), 2322; https://doi.org/10.3390/ma13102322
Received: 15 April 2020 / Revised: 8 May 2020 / Accepted: 14 May 2020 / Published: 18 May 2020
(This article belongs to the Section Optics and Photonics)
Novel functionalities of disorder-induced scattering effect in random lasers, attributed to low spatial coherence, draw remarkable attention in high-contrast to superior quality speckle-free imaging applications. This paper demonstrates perovskite-polystyrene (PS)-based random lasing action with robust optical performance at room temperature. Optical characterizations are carried out upon perovskite thin films addition with polystyrene of different mixing concentrations (wt.%). A low threshold lasing operation is achieved with an increasing concentration of polystyrene, accompanying a wavy surface texture with high surface roughness. The rough surface dominating multiple scattering effects leads to enhanced feedback efficiency. Moreover, this study also elucidates efficient fabrication process steps for the development of high quality and durable PS-based random lasers. With the advantages of reduced coherent artifacts and low spatial coherence, speckle free projection images of the USAF (U. S. Air Force MIL-STD-150A standard of 1951) resolution test chart are shown for different PS-based random lasers. View Full-Text
Keywords: perovskite; random lasers; passivation layer; multiple scattering effect; speckle free image projection perovskite; random lasers; passivation layer; multiple scattering effect; speckle free image projection
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MDPI and ACS Style

Mallick, S.P.; Hong, Y.-H.; Chen, L.-R.; Kao, T.S.; Lu, T.-C. Effect of Passivation Layer on the Thin Film Perovskite Random Lasers. Materials 2020, 13, 2322.

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