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Open AccessArticle

Structure Quality of LuFeO3 Epitaxial Layers Grown by Pulsed-Laser Deposition on Sapphire/Pt

1
Institute for Photon Science and Synchrotron Radiation, Karlsruhe Institute of Technology, Hermann-von-Helmholtz-Platz 1, D-76344 Eggenstein-Leopoldshafen, Germany
2
Department of Solid State Physics, Charles University, Ke Karlovu 5, 121 16 Prague, Czech Republic
3
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Engesserstr. 7, D-76131 Karlsruhe, Germany
4
CEITEC, Masaryk University, Kotlářská 2, 611 37 Brno, Czech Republic
*
Author to whom correspondence should be addressed.
Materials 2020, 13(1), 61; https://doi.org/10.3390/ma13010061
Received: 3 December 2019 / Revised: 17 December 2019 / Accepted: 18 December 2019 / Published: 21 December 2019
Structural quality of LuFeO 3 epitaxial layers grown by pulsed-laser deposition on sapphire substrates with and without platinum Pt interlayers has been investigated by in situ high-resolution X-ray diffraction (reciprocal-space mapping). The parameters of the structure such as size and misorientation of mosaic blocks have been determined as functions of the thickness of LuFeO 3 during growth and for different thicknesses of platinum interlayers up to 40 nm. By means of fitting of the time-resolved X-ray reflectivity curves and by in situ X-ray diffraction measurement, we demonstrate that the LuFeO 3 growth rate as well as the out-of-plane lattice parameter are almost independent from Pt interlayer thickness, while the in-plane LuFeO 3 lattice parameter decreases. We reveal that, despite the different morphologies of the Pt interlayers with different thickness, LuFeO 3 was growing as a continuous mosaic layer and the misorientation of the mosaic blocks decreases with increasing Pt thickness. The X-ray diffraction results combined with ex situ scanning electron microscopy and high-resolution transmission electron microscopy demonstrate that the Pt interlayer significantly improves the structure of LuFeO 3 by reducing the misfit of the LuFeO 3 lattice with respect to the material underneath. View Full-Text
Keywords: pulsed-laser deposition; in situ X-ray diffraction; electron microscopy; multiferroics pulsed-laser deposition; in situ X-ray diffraction; electron microscopy; multiferroics
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Bauer, S.; Rodrigues, A.; Horák, L.; Jin, X.; Schneider, R.; Baumbach, T.; Holý, V. Structure Quality of LuFeO3 Epitaxial Layers Grown by Pulsed-Laser Deposition on Sapphire/Pt. Materials 2020, 13, 61.

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