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Journal: Materials, 2019
Volume: 12
Number: 2741

Article: Radiation Response of Negative Gate Biased SiC MOSFETs
Authors: by Akinori Takeyama, Takahiro Makino, Shuichi Okubo, Yuki Tanaka, Toru Yoshie, Yasuto Hijikata and Takeshi Ohshima
Link: https://www.mdpi.com/1996-1944/12/17/2741

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