The Effect of Crystal Defects on 3D High-Resolution Diffraction Peaks: A FFT-Based Method
AbstractForward modeling of diffraction peaks is a potential way to compare the results of theoretical mechanical simulations and experimental X-ray diffraction (XRD) data recorded during in situ experiments. As the input data are the strain or displacement field within a representative volume of the material containing dislocations, a computer-aided efficient and accurate method to generate these fields is necessary. With this aim, a current and promising numerical method is based on the use of the fast Fourier transform (FFT)-based method. However, classic FFT-based methods present some numerical artifacts due to the Gibbs phenomenon or “aliasing” and to “voxelization” effects. Here, we propose several improvements: first, a consistent discrete Green operator to remove “aliasing” effects; and second, a method to minimize the voxelization artifacts generated by dislocation loops inclined with respect to the computational grid. Then, we show the effect of these improvements on theoretical diffraction peaks. View Full-Text
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Eloh, K.S.; Jacques, A.; Ribarik, G.; Berbenni, S. The Effect of Crystal Defects on 3D High-Resolution Diffraction Peaks: A FFT-Based Method. Materials 2018, 11, 1669.
Eloh KS, Jacques A, Ribarik G, Berbenni S. The Effect of Crystal Defects on 3D High-Resolution Diffraction Peaks: A FFT-Based Method. Materials. 2018; 11(9):1669.Chicago/Turabian Style
Eloh, Komlavi S.; Jacques, Alain; Ribarik, Gabor; Berbenni, Stéphane. 2018. "The Effect of Crystal Defects on 3D High-Resolution Diffraction Peaks: A FFT-Based Method." Materials 11, no. 9: 1669.
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