Fretting Wear Behavior and Photoelectron Spectroscopy (XPS) Analysis of a Ti/TiN Multilayer Film Deposited on Depleted Uranium
Zhu, S.; Wu, Y.; Li, Z.; Fang, L.; Yin, A.; Yan, J.; Jiang, F.; Meng, X.; Chen, P.; Cai, Z. Fretting Wear Behavior and Photoelectron Spectroscopy (XPS) Analysis of a Ti/TiN Multilayer Film Deposited on Depleted Uranium. Materials 2018, 11, 1538. https://doi.org/10.3390/ma11091538
Zhu S, Wu Y, Li Z, Fang L, Yin A, Yan J, Jiang F, Meng X, Chen P, Cai Z. Fretting Wear Behavior and Photoelectron Spectroscopy (XPS) Analysis of a Ti/TiN Multilayer Film Deposited on Depleted Uranium. Materials. 2018; 11(9):1538. https://doi.org/10.3390/ma11091538
Chicago/Turabian StyleZhu, Shengfa, Yanping Wu, Zhengyang Li, Liping Fang, Anyi Yin, Jiawei Yan, Fan Jiang, Xiandong Meng, Piheng Chen, and Zhenbing Cai. 2018. "Fretting Wear Behavior and Photoelectron Spectroscopy (XPS) Analysis of a Ti/TiN Multilayer Film Deposited on Depleted Uranium" Materials 11, no. 9: 1538. https://doi.org/10.3390/ma11091538


