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Open AccessArticle

Evaluation of Fracture Strength of Ceramics Containing Small Surface Defects Introduced by Focused Ion Beam

1
Graduate School of Engineering, Yokohama National University, 79-5 Tokiwadai, Hodogaya, Yokohama 240-8501, Japan
2
Faculty of Engineering, Yokohama National University, 79-5 Tokiwadai, Hodogaya, Yokohama 240-8501, Japan
*
Author to whom correspondence should be addressed.
Materials 2018, 11(3), 457; https://doi.org/10.3390/ma11030457
Received: 9 February 2018 / Revised: 13 March 2018 / Accepted: 19 March 2018 / Published: 20 March 2018
(This article belongs to the Section Structure Analysis and Characterization)
The aim of this study was to clarify the effects of micro surface defects introduced by the focused ion beam (FIB) technique on the fracture strength of ceramics. Three-point bending tests on alumina-silicon carbide (Al2O3/SiC) ceramic composites containing crack-like surface defects introduced by FIB were carried out. A surface defect with a r e a in the range 19 to 35 µm was introduced at the center of each specimen. Test results showed that the fracture strengths of the FIB-defect specimens depended on a r e a . The test results were evaluated using the evaluation equation of fracture strength based on the process zone size failure criterion and the a r e a parameter model. The experimental results indicate that FIB-induced defects can be used as small initial cracks for the fracture strength evaluation of ceramics. Moreover, the proposed equation was useful for the fracture strength evaluation of ceramics containing micro surface defects introduced by FIB. View Full-Text
Keywords: Al2O3/SiC; focused ion beam; surface defect; fracture strength; process zone size failure criterion; a r e a parameter model Al2O3/SiC; focused ion beam; surface defect; fracture strength; process zone size failure criterion; a r e a parameter model
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Sato, N.; Takahashi, K. Evaluation of Fracture Strength of Ceramics Containing Small Surface Defects Introduced by Focused Ion Beam. Materials 2018, 11, 457.

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