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Journal: Materials, 2018
Volume: 11
Number: 416
Article:
A Semi-Analytical Extraction Method for Interface and Bulk Density of States in Metal Oxide Thin-Film Transistors
Authors:
by
Weifeng Chen, Weijing Wu, Lei Zhou, Miao Xu, Lei Wang, Honglong Ning and Junbiao Peng
Link:
https://www.mdpi.com/1996-1944/11/3/416
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