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Journal: Materials, 2018
Volume: 11
Number: 2502
Article:
A Comparative Study of E-Beam Deposited Gate Dielectrics on Channel Width-Dependent Performance and Reliability of a-IGZO Thin-Film Transistors
Authors:
by
Gwomei Wu, Anup K. Sahoo, Dave W. Chen and J. W. Chang
Link:
https://www.mdpi.com/1996-1944/11/12/2502
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