Chen, H.; Cao, Y.; Yu, J.; Zhai, X.; Peng, J.; Cheng, W.; Hao, T.; Zhang, X.; Zhu, W.
Quantitative Characterization Method of Additional Resistance Based on Suspended Particle Migration and Deposition Model. Energies 2024, 17, 6246.
https://doi.org/10.3390/en17246246
AMA Style
Chen H, Cao Y, Yu J, Zhai X, Peng J, Cheng W, Hao T, Zhang X, Zhu W.
Quantitative Characterization Method of Additional Resistance Based on Suspended Particle Migration and Deposition Model. Energies. 2024; 17(24):6246.
https://doi.org/10.3390/en17246246
Chicago/Turabian Style
Chen, Huan, Yanfeng Cao, Jifei Yu, Xiaopeng Zhai, Jianlin Peng, Wei Cheng, Tongchuan Hao, Xiaotong Zhang, and Weitao Zhu.
2024. "Quantitative Characterization Method of Additional Resistance Based on Suspended Particle Migration and Deposition Model" Energies 17, no. 24: 6246.
https://doi.org/10.3390/en17246246
APA Style
Chen, H., Cao, Y., Yu, J., Zhai, X., Peng, J., Cheng, W., Hao, T., Zhang, X., & Zhu, W.
(2024). Quantitative Characterization Method of Additional Resistance Based on Suspended Particle Migration and Deposition Model. Energies, 17(24), 6246.
https://doi.org/10.3390/en17246246
