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Journal: Energies, 2023
Volume: 16
Number: 1771

Article: Electrically Active Defects in SiC Power MOSFETs
Authors: by Mayank Chaturvedi, Daniel Haasmann, Hamid Amini Moghadam and Sima Dimitrijev
Link: https://www.mdpi.com/1996-1073/16/4/1771

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