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Journal: Energies, 2023
Volume: 16
Number: 599
599
Article: Deep Level Transient Fourier Spectroscopy Investigation of Electron Traps on AlGaN/GaN-on-Si Power Diodes
Authors: by Florian Rigaud-Minet, Christophe Raynaud, Julien Buckley, Matthew Charles, Patricia Pimenta-Barros, Romain Gwoziecki, Charlotte Gillot, Véronique Sousa, Hervé Morel and Dominique Planson
Link: https://www.mdpi.com/1996-1073/16/2/599

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