Du, C.; Xia, D.; Huang, Q.; Mao, C.; Cui, Z.; Fang, W.; Nie, X.
Research on Electromagnetic Susceptibility of Electronic Modules in Component-Level HEMP PCI Test. Energies 2022, 15, 1409.
https://doi.org/10.3390/en15041409
AMA Style
Du C, Xia D, Huang Q, Mao C, Cui Z, Fang W, Nie X.
Research on Electromagnetic Susceptibility of Electronic Modules in Component-Level HEMP PCI Test. Energies. 2022; 15(4):1409.
https://doi.org/10.3390/en15041409
Chicago/Turabian Style
Du, Chuanbao, Dewei Xia, Quan Huang, Congguang Mao, Zhitong Cui, Wenxiao Fang, and Xin Nie.
2022. "Research on Electromagnetic Susceptibility of Electronic Modules in Component-Level HEMP PCI Test" Energies 15, no. 4: 1409.
https://doi.org/10.3390/en15041409
APA Style
Du, C., Xia, D., Huang, Q., Mao, C., Cui, Z., Fang, W., & Nie, X.
(2022). Research on Electromagnetic Susceptibility of Electronic Modules in Component-Level HEMP PCI Test. Energies, 15(4), 1409.
https://doi.org/10.3390/en15041409