Liu, B.-Y.; Wang, G.-S.; Tseng, M.-L.; Wu, K.-J.; Li, Z.-G.
Exploring the Electro-Thermal Parameters of Reliable Power Modules: Insulated Gate Bipolar Transistor Junction and Case Temperature. Energies 2018, 11, 2371.
https://doi.org/10.3390/en11092371
AMA Style
Liu B-Y, Wang G-S, Tseng M-L, Wu K-J, Li Z-G.
Exploring the Electro-Thermal Parameters of Reliable Power Modules: Insulated Gate Bipolar Transistor Junction and Case Temperature. Energies. 2018; 11(9):2371.
https://doi.org/10.3390/en11092371
Chicago/Turabian Style
Liu, Bo-Ying, Gao-Sheng Wang, Ming-Lang Tseng, Kuo-Jui Wu, and Zhi-Gang Li.
2018. "Exploring the Electro-Thermal Parameters of Reliable Power Modules: Insulated Gate Bipolar Transistor Junction and Case Temperature" Energies 11, no. 9: 2371.
https://doi.org/10.3390/en11092371
APA Style
Liu, B.-Y., Wang, G.-S., Tseng, M.-L., Wu, K.-J., & Li, Z.-G.
(2018). Exploring the Electro-Thermal Parameters of Reliable Power Modules: Insulated Gate Bipolar Transistor Junction and Case Temperature. Energies, 11(9), 2371.
https://doi.org/10.3390/en11092371