Li, W.; Li, G.; Zeng, R.; Ni, K.; Hu, Y.; Wen, H.
The Fault Detection, Localization, and Tolerant Operation of Modular Multilevel Converters with an Insulated Gate Bipolar Transistor (IGBT) Open Circuit Fault. Energies 2018, 11, 837.
https://doi.org/10.3390/en11040837
AMA Style
Li W, Li G, Zeng R, Ni K, Hu Y, Wen H.
The Fault Detection, Localization, and Tolerant Operation of Modular Multilevel Converters with an Insulated Gate Bipolar Transistor (IGBT) Open Circuit Fault. Energies. 2018; 11(4):837.
https://doi.org/10.3390/en11040837
Chicago/Turabian Style
Li, Wei, Gengyin Li, Rong Zeng, Kai Ni, Yihua Hu, and Huiqing Wen.
2018. "The Fault Detection, Localization, and Tolerant Operation of Modular Multilevel Converters with an Insulated Gate Bipolar Transistor (IGBT) Open Circuit Fault" Energies 11, no. 4: 837.
https://doi.org/10.3390/en11040837
APA Style
Li, W., Li, G., Zeng, R., Ni, K., Hu, Y., & Wen, H.
(2018). The Fault Detection, Localization, and Tolerant Operation of Modular Multilevel Converters with an Insulated Gate Bipolar Transistor (IGBT) Open Circuit Fault. Energies, 11(4), 837.
https://doi.org/10.3390/en11040837