Technostress Dark Side of Technology in the Workplace: A Scientometric Analysis
Bondanini, G.; Giorgi, G.; Ariza-Montes, A.; Vega-Muñoz, A.; Andreucci-Annunziata, P. Technostress Dark Side of Technology in the Workplace: A Scientometric Analysis. Int. J. Environ. Res. Public Health 2020, 17, 8013. https://doi.org/10.3390/ijerph17218013
Bondanini G, Giorgi G, Ariza-Montes A, Vega-Muñoz A, Andreucci-Annunziata P. Technostress Dark Side of Technology in the Workplace: A Scientometric Analysis. International Journal of Environmental Research and Public Health. 2020; 17(21):8013. https://doi.org/10.3390/ijerph17218013
Chicago/Turabian StyleBondanini, Giorgia, Gabriele Giorgi, Antonio Ariza-Montes, Alejandro Vega-Muñoz, and Paola Andreucci-Annunziata. 2020. "Technostress Dark Side of Technology in the Workplace: A Scientometric Analysis" International Journal of Environmental Research and Public Health 17, no. 21: 8013. https://doi.org/10.3390/ijerph17218013


