Tian, J.; Zhang, R.; Su, H.; Sun, X.; Chen, S.; Xia, J.
An Automatic Instrument to Study the Spatial Scaling Behavior of Emissivity. Sensors 2008, 8, 800-816.
https://doi.org/10.3390/s8020800
AMA Style
Tian J, Zhang R, Su H, Sun X, Chen S, Xia J.
An Automatic Instrument to Study the Spatial Scaling Behavior of Emissivity. Sensors. 2008; 8(2):800-816.
https://doi.org/10.3390/s8020800
Chicago/Turabian Style
Tian, Jing, Renhua Zhang, Hongbo Su, Xiaomin Sun, Shaohui Chen, and Jun Xia.
2008. "An Automatic Instrument to Study the Spatial Scaling Behavior of Emissivity" Sensors 8, no. 2: 800-816.
https://doi.org/10.3390/s8020800
APA Style
Tian, J., Zhang, R., Su, H., Sun, X., Chen, S., & Xia, J.
(2008). An Automatic Instrument to Study the Spatial Scaling Behavior of Emissivity. Sensors, 8(2), 800-816.
https://doi.org/10.3390/s8020800