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Journal: Sensors, 2026
Volume: 26
Number: 436

Article: Optical Microscopy for High-Resolution IPMC Displacement Measurement
Authors: by Dimitrios Minas, Kyriakos Tsiakmakis, Argyrios T. Hatzopoulos, Konstantinos A. Tsintotas, Vasileios Vassios and Maria S. Papadopoulou
Link: https://www.mdpi.com/1424-8220/26/2/436

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