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Journal: Sensors, 2025
Volume: 25
Number: 2277

Article: THRU–REFLECT Method for Scattering Parameter Extraction from Back-to-Back Measurements of Waveguide Components
Authors: by Songyuan Xu, Jiwon Heo, Chan-Soo Lee, Ki-Hong Kim and Bierng-Chearl Ahn
Link: https://www.mdpi.com/1424-8220/25/7/2277

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