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Journal: Sensors, 2025
Volume: 25
Number: 2277
Article:
THRU–REFLECT Method for Scattering Parameter Extraction from Back-to-Back Measurements of Waveguide Components
Authors:
by
Songyuan Xu, Jiwon Heo, Chan-Soo Lee, Ki-Hong Kim and Bierng-Chearl Ahn
Link:
https://www.mdpi.com/1424-8220/25/7/2277
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