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Journal: Sensors, 2025
Volume: 25
Number: 1703

Article: Enhanced Vision-Based Quality Inspection: A Multiview Artificial Intelligence Framework for Defect Detection
Authors: by Geethika Bhavanasi, Davy Neven, Manuel Arteaga, Sina Ditzel, Sam Dehaeck and Abdellatif Bey-Temsamani
Link: https://www.mdpi.com/1424-8220/25/6/1703

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