Bhavanasi, G.; Neven, D.; Arteaga, M.; Ditzel, S.; Dehaeck, S.; Bey-Temsamani, A.
Enhanced Vision-Based Quality Inspection: A Multiview Artificial Intelligence Framework for Defect Detection. Sensors 2025, 25, 1703.
https://doi.org/10.3390/s25061703
AMA Style
Bhavanasi G, Neven D, Arteaga M, Ditzel S, Dehaeck S, Bey-Temsamani A.
Enhanced Vision-Based Quality Inspection: A Multiview Artificial Intelligence Framework for Defect Detection. Sensors. 2025; 25(6):1703.
https://doi.org/10.3390/s25061703
Chicago/Turabian Style
Bhavanasi, Geethika, Davy Neven, Manuel Arteaga, Sina Ditzel, Sam Dehaeck, and Abdellatif Bey-Temsamani.
2025. "Enhanced Vision-Based Quality Inspection: A Multiview Artificial Intelligence Framework for Defect Detection" Sensors 25, no. 6: 1703.
https://doi.org/10.3390/s25061703
APA Style
Bhavanasi, G., Neven, D., Arteaga, M., Ditzel, S., Dehaeck, S., & Bey-Temsamani, A.
(2025). Enhanced Vision-Based Quality Inspection: A Multiview Artificial Intelligence Framework for Defect Detection. Sensors, 25(6), 1703.
https://doi.org/10.3390/s25061703