van Herpt, K.; Bajgholi, M.E.; Underhill, P.R.; Mandache, C.; Krause, T.W.
Enhanced Near-Surface Flaw Detection in Additively Manufactured Metal Ti-5Al-5V-5Mo-3Cr Using the Total Focusing Method. Sensors 2025, 25, 6425.
https://doi.org/10.3390/s25206425
AMA Style
van Herpt K, Bajgholi ME, Underhill PR, Mandache C, Krause TW.
Enhanced Near-Surface Flaw Detection in Additively Manufactured Metal Ti-5Al-5V-5Mo-3Cr Using the Total Focusing Method. Sensors. 2025; 25(20):6425.
https://doi.org/10.3390/s25206425
Chicago/Turabian Style
van Herpt, Kate, Mohammad E. Bajgholi, P. Ross Underhill, Catalin Mandache, and Thomas W. Krause.
2025. "Enhanced Near-Surface Flaw Detection in Additively Manufactured Metal Ti-5Al-5V-5Mo-3Cr Using the Total Focusing Method" Sensors 25, no. 20: 6425.
https://doi.org/10.3390/s25206425
APA Style
van Herpt, K., Bajgholi, M. E., Underhill, P. R., Mandache, C., & Krause, T. W.
(2025). Enhanced Near-Surface Flaw Detection in Additively Manufactured Metal Ti-5Al-5V-5Mo-3Cr Using the Total Focusing Method. Sensors, 25(20), 6425.
https://doi.org/10.3390/s25206425