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Sensors
Volume 24
Issue 17
10.3390/s24175649
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Journal: Sensors, 2024
Volume: 24
Number: 5649

Article: Conductive Atomic Force Microscopy—Ultralow-Current Measurement Systems for Nanoscale Imaging of a Surface’s Electrical Properties
Authors: by Andrzej Sikora, Krzysztof Gajewski, Dominik Badura, Bartosz Pruchnik, Tomasz Piasecki, Kamil Raczkowski and Teodor Gotszalk
Link: https://www.mdpi.com/1424-8220/24/17/5649

MDPI offers high quality article reprints with convenient shipping to destinations worldwide. Each reprint features a 270 gsm bright white cover and 105 gsm premium white paper, bound with two stitches for durability and printed in full color. The cover design is customized to your article and designed to be complimentary to the journal.

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