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Journal: Sensors, 2024
Volume: 24
Number: 4380
4380
Article: Experimental Study on Damage Effect of Mid-Infrared Pulsed Laser on Charge Coupled Device (CCD) and HgCgTe Detectors
Authors: by Yang Liu, Feng Zhou, Yunzhe Wang, Yin Zhang, Yunfeng Zhang, Hanyu Zheng and Junfeng Shao
Link: https://www.mdpi.com/1424-8220/24/13/4380

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