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Journal: Sensors, 2024
Volume: 24
Number: 3459

Article: On-Machine LTS Integration for Layer-Wise Surface Quality Characterization in MEX/P
Authors: by Alejandro Fernández, Pablo Zapico, David Blanco, Fernando Peña, Natalia Beltrán and Sabino Mateos
Link: https://www.mdpi.com/1424-8220/24/11/3459

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