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Journal: Sensors, 2024
Volume: 24
Number: 3459
Article:
On-Machine LTS Integration for Layer-Wise Surface Quality Characterization in MEX/P
Authors:
by
Alejandro Fernández, Pablo Zapico, David Blanco, Fernando Peña, Natalia Beltrán and Sabino Mateos
Link:
https://www.mdpi.com/1424-8220/24/11/3459
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