Fernández, A.; Zapico, P.; Blanco, D.; Peña, F.; Beltrán, N.; Mateos, S.
On-Machine LTS Integration for Layer-Wise Surface Quality Characterization in MEX/P. Sensors 2024, 24, 3459.
https://doi.org/10.3390/s24113459
AMA Style
Fernández A, Zapico P, Blanco D, Peña F, Beltrán N, Mateos S.
On-Machine LTS Integration for Layer-Wise Surface Quality Characterization in MEX/P. Sensors. 2024; 24(11):3459.
https://doi.org/10.3390/s24113459
Chicago/Turabian Style
Fernández, Alejandro, Pablo Zapico, David Blanco, Fernando Peña, Natalia Beltrán, and Sabino Mateos.
2024. "On-Machine LTS Integration for Layer-Wise Surface Quality Characterization in MEX/P" Sensors 24, no. 11: 3459.
https://doi.org/10.3390/s24113459
APA Style
Fernández, A., Zapico, P., Blanco, D., Peña, F., Beltrán, N., & Mateos, S.
(2024). On-Machine LTS Integration for Layer-Wise Surface Quality Characterization in MEX/P. Sensors, 24(11), 3459.
https://doi.org/10.3390/s24113459