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Journal: Sensors, 2024
Volume: 24
Number: 17

Article: Simultaneous Measurement of Group Refractive Index Dispersion and Thickness of Fused Silica Using a Scanning White Light Interferometer
Authors: by Heesu Lee, Seungjin Hwang, Hong Jin Kong, Kyung Hee Hong and Tae Jun Yu
Link: https://www.mdpi.com/1424-8220/24/1/17

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