Haque, M.S.; Moniruzzaman, M.; Choi, S.; Kwak, S.; Okilly, A.H.; Baek, J.
A Fast Loss Model for Cascode GaN-FETs and Real-Time Degradation-Sensitive Control of Solid-State Transformers. Sensors 2023, 23, 4395.
https://doi.org/10.3390/s23094395
AMA Style
Haque MS, Moniruzzaman M, Choi S, Kwak S, Okilly AH, Baek J.
A Fast Loss Model for Cascode GaN-FETs and Real-Time Degradation-Sensitive Control of Solid-State Transformers. Sensors. 2023; 23(9):4395.
https://doi.org/10.3390/s23094395
Chicago/Turabian Style
Haque, Moinul Shahidul, Md Moniruzzaman, Seungdeog Choi, Sangshin Kwak, Ahmed H. Okilly, and Jeihoon Baek.
2023. "A Fast Loss Model for Cascode GaN-FETs and Real-Time Degradation-Sensitive Control of Solid-State Transformers" Sensors 23, no. 9: 4395.
https://doi.org/10.3390/s23094395
APA Style
Haque, M. S., Moniruzzaman, M., Choi, S., Kwak, S., Okilly, A. H., & Baek, J.
(2023). A Fast Loss Model for Cascode GaN-FETs and Real-Time Degradation-Sensitive Control of Solid-State Transformers. Sensors, 23(9), 4395.
https://doi.org/10.3390/s23094395