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Journal: Sensors, 2023
Volume: 23
Number: 5878

Article: Quantification of Structural Defects Using Pixel Level Spatial Information from Photogrammetry
Authors: by Youheng Guo, Xuesong Shen, James Linke, Zihao Wang and Khalegh Barati
Link: https://www.mdpi.com/1424-8220/23/13/5878

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