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Journal: Sensors, 2022
Volume: 22
Number: 6644

Article: Weak Fault Feature Extraction Method Based on Improved Stochastic Resonance
Authors: by Zhen Yang, Zhiqian Li, Fengxing Zhou, Yajie Ma and Baokang Yan
Link: https://www.mdpi.com/1424-8220/22/17/6644

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